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Newsroom Enjoy the latest news from EOS/ESD Association, Inc.!

  • Standardizing Processes for Technology and Manufacturing - EOS/ESD Association, Inc. Sr. Executive Director Lisa Pimpinella - IgniteU NY Podcast
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  • Article
    April 1, 2021

    Advances in CMOS Technologies Leading to Lower CDM Target Levels

    Can you continue aiming for typical CDM protection levels?IntroductionThe ESD Design Window (ESD-DW) has been steadily shrinking over time due to technology scaling not only from a smaller feature size…

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  • Article
    March 1, 2021

    Evolution of Charged Device Model ESD Target Requirements

    Historical Background CDM is an important model for ESD qualification. The well-known CDM refers to the discharge of an IC package to a grounded surface, whether from automatic handlers in…

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  • Blog Post
    March 1, 2021

    Device Failure From The Initial Current Step Of A CDM Discharge

    Editor’s Note:  The paper on which this article is based was originally presented at the 40th Annual EOS/ESD Symposium, where it was awarded the Symposium Outstanding Paper in 2019.  IntroductionRF interfaces tend to…

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  • Article
    February 1, 2021

    ESD Issues for Flat Panel Displays

    Introduction to Flat Panel Displays and the Current State of the ArtElectronic displays have been widely adopted around the world, and information displays have become an essential part of human…

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  • Article
    January 1, 2021

    Two Pin HBM Testing: A New Option?

    Human Body Model (HBM) is the original ESD test method for semiconductor devices and is still the most widely used ESD test [1]. This article will discuss the old, but…

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  • Article
    December 1, 2020

    System-Level Simulation Solutions for EOS and ESD

    As electronic systems become more pervasive in today’s world, particularly in mission critical systems, it becomes more imperative that they do not fail within the warranty period. Electrical overstress (EOS)…

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