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Charged Device Model (CDM) discharge events are the major root cause for Electrostatic Discharge (ESD) failures in a modern, automated production and test environment. The CDM stress testing is well…

By Michael J. McCarthy Staff Reporter of The Wall Street Journal Published July 24, 1996 https://www.wsj.com/articles/SB838158289179103000 This may come as a bit of a shock, but static electricity is a hair-raising problem. In…

Ok, let’s start with the basics. What is latch-up, and why do designers care about it?In today’s tightly packed layouts, most integrated circuits (ICs) end up with parasitic bipolar transistors…

Roughly a decade ago, starting at 22nm technology nodes, the transistor architecture changed from planar to FinFET [1-3]. Bulk FinFET (FF) which is a multi-gate transistor built on Si substrate…

The 2020 EOS/ESD Symposium in September 2020 featured a new EMC Special Session, held on the Wednesday of the Symposium, organized in cooperation between the EMC Society and EOS/ESD Association,…

It is well understood that static electricity has been with us forever. Our awareness of problems associated with static electricity probably originated with the invention of gun powder when, no…