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The 2020 EOS/ESD Symposium in September 2020 featured a new EMC Special Session, held on the Wednesday of the Symposium, organized in cooperation between the EMC Society and EOS/ESD Association,…

It is well understood that static electricity has been with us forever. Our awareness of problems associated with static electricity probably originated with the invention of gun powder when, no…

For decades, Moore’s law has been driven by the downscaling of transistor dimensions on silicon. When reaching the ultra-advanced integrated circuit (IC) fabrication technologies in the single-digit nm regime (currently…

Can you continue aiming for typical CDM protection levels?IntroductionThe ESD Design Window (ESD-DW) has been steadily shrinking over time due to technology scaling not only from a smaller feature size…

Historical Background CDM is an important model for ESD qualification. The well-known CDM refers to the discharge of an IC package to a grounded surface, whether from automatic handlers in…

Editor’s Note:  The paper on which this article is based was originally presented at the 40th Annual EOS/ESD Symposium, where it was awarded the Symposium Outstanding Paper in 2019.  IntroductionRF interfaces tend to…