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Newsroom Enjoy the latest news from EOS/ESD Association, Inc.!

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  • Blog Post
    September 14, 2023

    Volunteer Newsletter

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  • Article
    August 1, 2023

    Can Electrostatic Discharge Design Problems Be Solved with Electronic Design Automation Tools Alone? Part 1

    Going back several decades, Electrostatic Discharge (ESD) design and layout checks that were done manually were laborious and time-consuming, let alone not confidently reliable. These issues have been exacerbated by...

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  • Article
    July 1, 2023

    The Dilemma Between Customers and Suppliers on EOS Failures

    Bridging the Gap using tAMRNever-ending EOS Customer Returns During the last four decades, damage to devices from electrical overstress (EOS) has confounded both IC suppliers and customers. The Industry Council on...

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  • Press Release
    June 26, 2023

    EOS/ESD Association, Inc. Completes STEM Series for Local Elementary School Students on Electrostatic Discharge

    June 26, 2023 Contact: Lisa Pimpinella, Executive Director, EOS/ESD Association, Inc. lpimpinella@esda.org, (315) 339-6937 ROME, NY – EOS/ESD Association, Inc. (ESDA) recently completed a four-part series of electrostatic discharge presentations for over...

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  • Article
    June 1, 2023

    The Transistor: An Indispensable ESD Protection Device – Part 2

    The invention of the bipolar transistor and later the MOS transistor evolution into wide applications for ESD protection in the semiconductor technologies was previously published in the January 2023 issue...

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  • Article
    May 1, 2023

    Updated Trends in Charge Device Model (CDM)

    Charged device events are by far the leading cause of electrostatic discharge (ESD) damage in modern electronics manufacturing facilities. If an integrated circuit contacts a conducting surface at a different...

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EOS/ESD Association, Inc.
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