WG 23.0 – Electrical Overstress (EOS) Best Practices

Status:
Active
Working Group Chair:
Terry Welsher, Dangelmayer Associates
  • Agenda items for the meeting on June 18, 10:15 – 11:45 AM EDT are:

    Pending

  •  Summary of meeting activities:
    The working group completed adjudication of all TAS comments on ESD TR23.0-01. A presentation was given on the SEMI 176. The group also discussed the next steps for a new document - EOS Control Program and EOS Replication Testing.

    Agenda items for the meeting on April 12, 1:00 – 3:00 PM PT are:

    • Address remaining issues with TR23
    • Plan for next revision
    • Walk-On Items
  • The group continued adjudicating technical advisory and support committee comments on a new technical report for the best practice for mitigation of EOS in manufacturing and test.

  • Agenda items for the meeting on September 6, 2017, 8:00 – 10:00 AM MST are:

    1. Introductions
    2. ESDA Announcements and Policies
    3. Review TAS Comments on TR
    4. Discuss Next Steps
    5. Walk-On Items 
  • Summary of meeting activities
    The working group continued working on a technical report for best practices of EOS mitigation in manufacturing and test including agreement on a new section explaining new definitions of EOS and related terms.

    Agenda items for the meeting on July 17, 2017, 12:00 – 1:30 PM ET are:

    • Review changes to document
    • Paragraph on new EOS definitions
    • 4.3-4.12 organization
    • Review status of remaining action items
  • Summary of meeting activities
    A presentation was given on how EMI becomes EOS. The working group continued working on a technical report for best practices of EOS mitigation in manufacturing and test.

    Agenda items for the meeting on April 27, 1:00 – 3:00 PM MT are: 

    • Presentation on EMI from Equipment
    • Review TR  Draft 
    • Document Schedule
    • Next steps (new material and/or document)
    • Walk-on items
  • Summary of meeting activities
    The working group continued working on a technical report for best practices for EOS mitigation in manufacturing and test.

    Agenda items for the meeting on Thursday, January 26, 2:00 - 3:30 PM ET are: 

    • Review goals of the working group
      • Status of Document
      • Assembly
      • Semiconductor Test
    • Future sections
      • Board/System Test
      • Auditing Best Practices
  • Summary of meeting activities
    The working group reviewed the updated scope, purpose, and two major technical sections of a new technical report. Volunteers were identified to write the remaining sections (definitions, references, etc). Topics for the next version of the technical report were also identified (board-level test and auditing).

    September 7, 2016, 1 - 3 pm PDT meeting agenda items:

    • Document Review
      • Assembly
      • Test
      • Other
      • Schedule next steps
  • Summary of meeting activities
    An introduction to the past work / work in progress of WG 23 was presented. Then the committee reviewed the major sections of a document currently being developed for assembly and test. More sections were identified and assigned to writers; the committee will continue reviewing at the September meeting.

    Thursday, July 14, 3-4 pm EST meeting agenda items:

    Review the latest drafts of the Assembly and Test Sections

  • Summary of meeting activities
    The committee discussed current progress on the individual sections of the EOS best practice technical report including sources of EOS in circuit assembly and test. The WG will continue to work on the technical report before and during the July virtual meeting. A presentation was give on measurements when high frequency disturbances; a section will be added to the technical report based on the information presented.

    Agenda
    Thursday, April 14, 1-3 PM meeting agenda items:

    1. Continue collecting and creating the sub-sections of the TR
  • Summary of meeting activities
    The committee discussed current progress on the individual sections of the EOS best practice technical report.