JWG – Charged Device Model (CDM) Device Testing

Status:
Active
Working Group Chair:
Terry Welsher, Dangelmayer Associates; Alan Righter, Analog Devices, Inc.

Related Documents

  • Summary of meeting activities:

    The joint committee reviewed the priority of topics for the five-year revision to ANSI/ESDA/JEDEC JS-002-2018. The status of the new standard practice on CC-TLP as well as the JS-002 user guide technical report were reviewed. A presentation was given on CDM measurement channel analysis.

  • Summary of meeting activities:

    The joint committee reviewed the five-year review plan and possible topics for revision to ANSI/ESDA/JEDEC JS-002-2018. An update was provided on a new standard practice on CC-TLP. The document is expected to be submitted to TAS after the April meeting series. The group also discussed the on-going round robin for low impedance contact CDM.

  • Summary of meeting activities:

    The status of the round robin and data collected on LICCDM was presented. Also, an update on the status of the new user guide for ANSI/ESDA/JEDEC JS-002 was given. The joint working group reviewed member comments on a new standard practice for CC-TLP. Two presentations were given on a Symposium paper on an LICCDM study and a CDM High Slew Rate evaluation project proposal.

  • Summary of meeting activities:

    The history of the joint working group and documents was reviewed. Updates were given on the LICCDM / JS-002 data gathering project and the ANSI/ESDA/JEDEC JS-002 user guide.

  • Summary of meeting activities:

    The first draft of a new standard practice on CC-TLP was shared. A presentation was also given on CDM vs. CC-TLP correlation. The joint working group discussed planning and next steps for lab experiments on low-impedance CDM. An update was given on the status of the JS-002 user guide technical report.

  • Summary of meeting activities:

    A document status update for CDM documents was reviewed. A presentation was given on FICDM Tribo-charging issue on 1st discharge. And the group reviewed parking lot items / data gathering team updates.

  • Summary of meeting activities:

    The committee adjudicated industry review comments for ESDA/JEDEC JDS-002-2018 and STDCOM comments for ESD WIP5.3.3. Presentations were given on “Preparing for Future CDM Test Methods”; “A Turnkey Method for Calculating Coaxial Cable Loss Effects on CDM Waveforms”; “Alumina Implementation on CDM Tester Field Plates”; “Problem with CDM Verfication Modules”; “Orion 3 CDM Target Analysis Update”; “Comparison of CDM and CC-TLP Results For A Ultra High Speed Interface IC”; and “Undesired Effects of CDM Stressing Non-Connected Pins”.

  • Summary of meeting activities:

    A brief review of the history and current working group documents was presented. Two presentations were given – the first on “Finite Elemental Analysis Electrostatic Study of JS-002 Verification Targets” and the second on “Capacitance Measurement and Flatness of CDM Targets”.

  • Summary of meeting activities:

    The joint committee reviewed the current status and next steps for ANSI/ESDA/JEDEC JS-002. It was decided by the group to draft a CDM “user guide” so an initial writing team was formed and a list of topics was generated. The group also discussed the next action items for seeking harmonization with JEITA for ANSI/ESDA/JEDEC JS-002.

     

  • Summary of meeting activities:

    The joint committee adjudicated technical and advisory support committee comments on ESD WIP5.3.3 and ESD TR5.3.1-01. A presentation was given on CDM measurement effects due to coaxial cable skin effect and dielectric losses.

  • Summary of meeting activities:

    The joint committee started reviewing working group member comments on ESD WIP5.3.3-2017 - low impedance contact CDM. Presentations were given on CC (capacitively coupled) TLP and correlation studies between CC-TLP and CDM-CC-TLP; CC-TLP Applications; and CDM tester improvement. There was a discussion on the next revisions for ANSI/ESDA/JEDEC JS-002 including a “hardware agnostic” version encompassing field induced and contact methods.

  • Summary of meeting activities:

    A brief overview of CDM, the history of the CDM joint working group, and current documents in process was given. A presentation on CDM measurement errors was presented by a working group member. An update on the status of a new standard practice, ESD WIP5.3.3, low-impedance contact CDM as an alternative CDM characterization method, was also given.

     

  • Summary of meeting activities:

    The joint working group adjudicated Technical and Advisory Support Committee comments on ESD TR5.3.1-01-1X. Six presentations were given on the direction of team experiments / writing of a low impedance CCDM work in progress document; two case studies on “Should we stress NC pins?”; three FICDM tester issues reported – NC pin stress affecting next pin stress, single discharge mode HV relay issue, and runt pulses with calibration module over charging plate vacuum hole for higher plate voltages; ANSI/ESDA/JEDEC JS-002 calibration concerns resulting in large product under stressing; FICDM DUT charging issues and resulting CCDM field plate recommendations; and proposed improvements to ANSI/ESDA/JEDEC JS-002.

  • Summary of meeting activities:

    A brief introduction and history of CDM and the joint working group was presented. A presentation was also give on Improving the CDM Test to Improve DUT Failure Repeatability. The committee also began reviewing and discussion items for the next revision of JS-002.

  • Summary of meeting activities:

    The joint working group adjudicated Technical and Administrative Support committee comments on the limited revision of ANSI/ESDA/JEDEC JS-002. Six presentations were given on low impedance CCDM (a technical report is planned for this topic); CC-TLP (a technical report is planned for this topic); a new CCDM method (contact first CDM); JS-002 frequency response/test head measurement; Symposium paper 4A.3 on ANSI/ESDA/JEDEC JS-002 testing; and an update on ERC CDM (measurement in manufacturing) project.

  • Summary of meeting activities:

    An introduction to CDM JWG and past work / work in progress was presented for guests new to the WG. A presentation was given on frequency specs relative to more accurate CDM data. Status updates were discussed for a new standard practice on CC-TLP and the JEDEC JESD47 ballot for incorporating JS-002 into JESD47.

  • Summary of meeting activities:

    The committee adjudicated TAS comments on the contact charged device model (CCDM) technical report, TR5.3.1-01. The document will be submitted for publication prior to the July virtual meeting.

    Four presentations were made on 2.5” vs 4.25” Ground Plate Ferrite Free Analysis; update on Low Impedance CCDM; Measurements of Bandwidth of Discharge Heads; and a review of the small package section 7.5 / Annex C draft for future revisions to ANSI/ESDA/JEDEC JS-002.

    The joint WG discussed plans for future experiments regarding the metrology section of ANSI/ESDA/JEDEC JS-002 and ground domain supply pin reduction. The committee also drafted a response to JEITA regarding harmonization questions and concerns related to JEITA’s contact CDM method.

  • Summary of meeting activities:

    A brief overview and history of the JWG was presented for new meeting attendees. WG member comments were adjudicated on the CCDM TR and a final version will be sent to the WG for approval to submit to TAS. The committee reviewed the proposal for a small package CDM section and normative annex in the next revision of ANSI/ESDA/JEDEC JS-002.