EOS/ESD Association, Inc.

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Symposium Year in Review

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2017 Symposium Program pdf

Year in Review: The Birth and the Life of an EOS/ESD Association, Inc. Standard

Kevin Duncan, Seagate Technology
Wednesday, September 13
8:00 a.m. - 8:40 a.m.

Your invited to sit back, relax, and take the journey with me as we follow documents’ path from infancy (proposal, technical review, working group assignment), through its’ adolescence (standards committee approval, industry review) and on into its’ golden years (5 year review, global harmonization). Along the way we will discuss the differences between the various acronyms and document designations. What they are, what they really mean, and how they should or shall be used. I will highlight the significant technical changes to ESDA documents over the last 5 years and provide an overview of new and exciting working group activities. Somewhere along the way, I may even tell a bad joke or two.

Year in Review: Transmission Line Pulse Testing for ESD

Theo Smedes, NXP Semiconductors
Thursday, September 14
8:00 a.m. - 8:40 a.m.

Transmission line pulse (TLP) testing is the de facto standard characterization and analysis tool for ESD circuit protection design. Thirty years after its introduction into the semiconductors world, the application landscape is still growing. At the same time, improvements and extensions are developed and introduced. This presentation will briefly summarize the history of TLP and the work of the ESDA working group 5.5. A new version of the TLP standard test method (ANSI/ESD STM 5.5.1) was released at the end of 2016. The changes in this document and currently ongoing work will be presented. Finally, a selection of the most relevant recent publications on TLP will be summarized and reviewed.