Newsroom Enjoy the latest news from EOS/ESD Association, Inc.!

by Matt Jane (Tesla), Andy Nold (Teradyne), Robert Gauthier (IBM), Lisa Pimpinella (ESDA)   Why get certified? Certification programs can provide you and your company with the knowledge, competency, and problem-solving skills needed…

The Charged Device Model (CDM) qualification level is essentially correlated to the peak ESD discharge current [1]. Hence, several modeling approaches have been proposed to predict CDM peak current for a given…

Contact: Lisa Pimpinella, Executive Director, EOS/ESD Association, Inc. lpimpinella@esda.org, (315) 339-6937 ROME, NY USA – EOS/ESD Association, Inc. (ESDA) announced the release of the EOS/ESD Association, Inc. Technology Roadmap. The goal…

In Part 1 and Part 2 of this series, we explored the opportunities for embedded on-chip and system-level ESD detection solutions. We introduced embedded detection technology and considerations for balancing ESD detection solutions with ESD protection requirements. In Part 3, we…

In Part 1 of this series, we introduced embedded detection technology, which augments basic protection against ESD events, and explored the opportunities for embedded ESD detection solutions. Protection sets the fundamental thresholds…

Press Release EOS/ESD Association, Inc. Launches Product Qualification Laboratory Certification at Canmax Technologies Co., Ltd., Suzhou, China December 1, 2023 Contact: Lisa Pimpinella, Executive Director, EOS/ESD Association, Inc. lpimpinella@esda.org, (315) 339-6937 ROME, NY –…