Newsroom Enjoy the latest news from EOS/ESD Association, Inc.!
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2022 EOS/ESD Association, Inc. Officers and Board Members Elected
Date: 01/01/2022 FOR IMMEDIATE RELEASE Contact: Lisa Pimpinella, Executive Director Phone: 315-339-6937 Email : lpimpinella@esda.org 2022 EOS/ESD Association, Inc. Officers and Board Members Elected Elected to the Board of Directors, by the members of EOS/ESD Association, Inc.,…
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Use of HBM and CDM Layout Simulation Tools
Why is the Use of these ESD Layout Simulation Tools Necessary?Electronic Design Automation (EDA) ESD verification tools have become instrumental to the design and verification flow of integrated circuits (IC’s).…
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What Are the Advantages of Capacitively Coupled TLP (CC-TLP)?
Charged Device Model (CDM) discharge events are the major root cause for Electrostatic Discharge (ESD) failures in a modern, automated production and test environment. The CDM stress testing is well…
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Device Failure From The Initial Current Step Of A CDM Discharge
Editor’s Note: The paper on which this article is based was originally presented at the 40th Annual EOS/ESD Symposium, where it was awarded the Symposium Outstanding Paper in 2019. IntroductionRF interfaces tend to…
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EOS/ESD Association to Support 3rd Annual Project Fibonacci® Steam Conference
On Thursday, May 10, 2018, Lisa Pimpinella, executive director of the EOS/ESD Association, and marketing administrator Brennan Pimpinella, presented a check for $3,000 to Project Fibonacci® Foundation founder Andy Drozd…
