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EOS/ESD Association, Inc. (ESDA) Certification Programs
by Matt Jane (Tesla), Andy Nold (Teradyne), Robert Gauthier (IBM), Lisa Pimpinella (ESDA) Why get certified? Certification programs can provide you and your company with the knowledge, competency, and problem-solving skills needed…
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Challenges of CDM Modeling for High-Speed Interface Devices
The Charged Device Model (CDM) qualification level is essentially correlated to the peak ESD discharge current [1]. Hence, several modeling approaches have been proposed to predict CDM peak current for a given…
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Integrating Embedded ESD Detection, Part 3
In Part 1 and Part 2 of this series, we explored the opportunities for embedded on-chip and system-level ESD detection solutions. We introduced embedded detection technology and considerations for balancing ESD detection solutions with ESD protection requirements. In Part 3, we…
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Implementing Embedded ESD Detection, Part 2
In Part 1 of this series, we introduced embedded detection technology, which augments basic protection against ESD events, and explored the opportunities for embedded ESD detection solutions. Protection sets the fundamental thresholds…
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Understanding Embedded On-Chip ESD Detection, Part 1
© 2019 Jeffrey C. Dunnihoo IntroductionElectrostatic Discharge (ESD) poses a significant threat to the reliability and longevity of electronic devices. As integrated circuits (ICs) continue to shrink in size and increase…
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CDE Modeling Using Star-Tree Impedance Networks for USB2 Cable
Previous studies of cable discharge events (CDE) have often used oversimplified models of the cable, such as a single 50Ω transmission line. This is not bad for an initial investigation,…
