How TVS Properties and Printed Circuit Board Design Influence Peak Voltage and Residual Current At An IC For USB-C Superspeed Data Lines
Steffen Holland, Nima Lotfi, Martin Pilaski, Burkhard Laue, Stefan…
Addressing an Industry Concern: The Demand for a CDM Bare Die Testing Method
Lena Zeitlhoefler, Theresa Lutz, Friedrich zur Nieden, Kai Esmark, Reinhold Gaertner, Infineon Technologies AG, on behalf of EOS/ESD…
WHY ESD Electronic Design Automation Checks ARE SO CRITICAL– PART 2
Eleonora Gevinti, Michael Khazhinsky, Ali Muhammad, Dolphin Abessolo Bidzo, Nicolas Richaud, Peter Koeppen, Kuo-Hsuan Meng, Vladislav Vashchenko, Andrei Shibkov, and…
WHY ESD Electronic Design Automation Checks ARE SO CRITICAL– PART 1
Eleonora Gevinti, Michael Khazhinsky, Ali Muhammad, Dolphin Abessolo Bidzo, Nicolas Richaud, Peter Koeppen, Kuo-Hsuan Meng, Vladislav Vashchenko, Andrei Shibkov, and…
AC and DC Ionization, the Whole Story
Iad Mirshad, Ed Oldynski, Simco-Ion, Technology Group on behalf of EOS/ESD Association, Inc.
Placing a target too close to an ionizer, whether AC or DC,…
PRESS RELEASE
New Partnership Announcement: EOS/ESD Association Services, LLC & SRF Technologies
March 6, 2025
Contact: Lisa Pimpinella, Sr. Executive Director, EOS/ESD Association, Inc. lpimpinella@esda.org, (315) 339-6937
ROME, NY USA – EOS/ESD Association Services,…