Certified Professionals

  • TR53®-2018 Certified

    Yan Li

    Dou Yee Static Control (Shanghai) Co., Ltd.
    Certified 2018
  • TR53®-2018 Certified

    Yang Yi Ou

    Advanced Semiconductor Engineering Group
  • TR53®-2018 Certified

    Yang Yun Zhong

    Dou Yee Singapore
    Certified 2019
  • Professional Program Manager Certification

    Yassine Kairouch

    Analog Devices
    Certified 2023
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    Yassine Kairouch is currently a Reliability Operation Engineer at Analog Devices holds a bachelor’s degree in electrical engineering from University of Massachusetts Lowell in 2018. His commitment to product reliability and safety led him to excel in ESD and Latch-up qualification. He meticulously planned and executed tests, developing innovative programs that adhered to JEDEC standards. Yassine was a collaboration expert, working seamlessly with internal and external vendors, designing test fixtures, and contributing to the reliability of testing processes. He also maintained a keen eye for precision, performing ESD and Latch-up characterization and providing timely updates to internal teams.

    Yassine extended his expertise to offer crucial technical support for high voltage endurance testing and equipment troubleshooting and repairing, including in-house testers. He continuously adapted to industry standards, ensuring processes remained at the forefront. Yassine's dedication extended to mentorship, transferring knowledge, instilling safety protocols, and helping new hires achieve proficiency in ESD and Latch-up testing. His holistic approach made him a respected luminary in the field of electrical engineering.

  • ESD Program Associate Certification

    Yasushi Megumi

    Shishido Electrostatics, Inc.
    Certified 2024
  • Compliance Verification Technician to TR53®

    Yee Chin Ong(伊君)

    Micron
    Certified 2022
  • TR53®-2018 Certified

    Yehoshua Salamon

    Marvell Israel
  • TR53®-2018 Certified

    Yi Wei Ching

    Advanced Semiconductor Engineering Group
  • TR53®-2018 Certified

    Yi-Xiu Xie

    Innolux Corporation
  • TR53®-2018 Certified

    Ying Cheng Pan

    Taiwan Semiconductor Manufacturing Co.
  • TR53®-2018 Certified

    Yishen Yang

    GEHC
  • ESD Control Program Auditor Certification

    Yixian Chen

    Bureau Veritas Certification (Beijing) Co., Ltd.
    Certified 2023
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  • Professional Program Manager Certification

    Yong Hoon (Joshua) Yoo

    CORE INSIGHT, INC.
    Certified 2011
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    Yong Hoon (Joshua) Yoo has been involved in the static control industry since 1994 for ionization, ESD measurement and high voltage power business operation in semiconductor, flat panel displays and automotive industry. He has been a member of EOS/ESD Association since 2000 and served as an Elected Board of Director in 2016 - 2018. He is the founder and president of Korea EOS/ESD Association since 2011. He is a member of Institute of Electronics and Information Engineers (Korean IEEE) since 2021. He is serving industry as Korea President of International Semiconductor Executive Summits (ISES) since 2024. 

    He started his volunteering activities on EOS/ESD Association since 2013 as an active working group members and technical program committee members of annual symposium for multiple events of ESD Association. With his leadership, Korea EOS/ESD Association very strongly presents and annual events over 10 years. He is pioneer for flat panel display (FPD) static issue analysis and resolved problems. In recently, he found a root cause of ESD yield losses in AI chip manufacturing environment and improved yield over double digits.

    He is an iNARTE certified ESD Engineer in 2007 and the EOS/ESD Association certified Professional ESD Program Manager in 2011. He has 14 patents for ionization system and ESD testing technologies.

     

    Credential ID: https://esdcertification.esda.org/en/c/de90a381cc6b4c1fa1b4d559a836bad8

     

  • TR53®-2018 Certified

    Yong Phing Ooi

    Intel
    Certified 2020
  • Device Stress Testing

    You Li

    IBM/Globalfoundries
    Certified 2013
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