WG 5.5 – Transmission Line Pulse (TLP) Device Testing

Summary of discussions/activities/document reviews:

• TR on Statistical Application of TLP
  • WG Review feedback: only 4 responses received L but with good inputs J
    • Discussed on scope, intention and clarification of terms, writing team will continue
  • Theo gave presentation by M. Nourani (UT Dallas) on 'AI-Driven TLP/VF-TLP Data Analysis’
    • Good Q&A. Mehrdad needs more data. Theo invited everyone to think about supplying data.
    • The discussion will be continued but outside TR scope.
• SP on Transient Analysis with VF-TLP
  • Robert presented proposal for Procedure to Verify VF-TLP Set-up for Transient Analysis
    • Additional measurements to be done after the quasi-static calibration, extended and short version
  • Andrea summarized measurements by STm/Qorvo/NXP on STm L/C/R/O/S calibration board
    • These can be used for a first application of the procedure mentioned above
    • Some discrepancies were observed between the labs and additional experiments are agreed

The meeting began with a presentation on preliminary data analysis of vF-TLP Kelvin automatic measurements, sparking a productive discussion with various comments and requests for the writing team. Following this, there was an engaging conversation on defining the transient region and overshoot for the SP on Transient Response, referencing TR5.5-05-20 as a starting point. Later, there was a presentation on the preliminary analysis of collected data in the L&C calibration study, followed by a comparison of simulation results with measurements. Both presentations stimulated fruitful discussions and led to the identification of next steps for the writing team.

A presentation on how oscilloscope usage impacts variation in test results and another on statistical applications of TLP (Transmission Line Pulsing) with examples sparked fruitful discussions among attendees. A presentation on the potential use of machine learning (ML) for parameter extraction focused on TLP curves as an example. The presentation generated engaging discussions, prompting the need for further exploration within the writing team. The group discussed transient response using various VF-TLP methods, measurements for a calibration study, and LCR characterization of the DUTs (Devices Under Test) used in the calibration study.

The WG discussed the technical report on statistical use of TLP.

• Automated measurement can be done by many; bottleneck is automated analysis (parameter extraction) of examples provided by the team.
• There was an interesting discussion on repeatability/outliers and sources of variation followed. Volunteers will repeat the experiments.

There was also a discussion on the standard practice on Transient Analysis with VF-TLP. 

• After presenting scope and goal, measurements on L/C in 4 probe conditions were shown and used to demonstrate verification methods of the transients:
• The question was asked: can we extract the L and C values from the transient waveforms?
• The definition of transient parameters, such as overshoot and turn-on time, was discussed.
• The measurement window, based on STM definitions, is not always useful for transient analysis. An option is to use reference data on a 50-ohm load.

A presentation on Ringing Requirements for VF-TLP was given.  

• Some problems with the present definitions were presented, in particular for VF-TLP. These mainly arise since definitions are based on the plateau or the last point of the pulse.
• Similar as above, this might be addressed by using a reference measurement instead.
• Another suggestion is to widen the specifications. Some customers interpret the STM as a requirement that their equipment must meet always. The STM is intended as a set of requirements that have been shown to yield accurate and repeatable results. Other uses may be valid and are allowed.

If you consider a presentation not yet on the agenda for this meeting, please let me know before Thursday, September 28.

WG adjudicated TAS comments on Section 2.11 of the User Guide. The WG reviewed the first data from an idea to use a capacitor and inductor as calibration structures for transient analysis. Initial results are promising and give guidance for suitable L and C values and also indicated some pitfalls that the WG needs to be aware of. WG reviewed the first data on statistical analysis that may be used to develop an SP on the subject. Some suitable data sets were presented, illustrating potential problems. The biggest challenge is automated parameter extraction and subsequent analysis filtering out incorrect data.

The WG discussed the preparation of a new SP on transient response, starting from the already released Technical Report “TR5.5-05 Transmission Line Pulse (TLP) – Transient Response Evaluation”. The WG discussed the work statement for an SP called, ‘Characterization of Transient Response of ESD protections using TLP testing’. This will be forwarded to the WG for review and will then be sent to TAS. A presentation was given on ‘Statistical Use of TLP’ as a possible next topic for WG. Discussions followed, with members being asked to forward their views on the subject to the WG Chair. The WG discussed whether there were any other new topics that the group would work on. Selected bandwidth/sampling rate effects as a topic for a new User/Application Guide section was highlighted.

An update was given on the status of the two documents currently under revision, “ANSI/ESD STM5.5.1 - Transmission Line Pulse (TLP) – Component Level” and “ESD TR5.5-04 - Transmission Line Pulse (TLP) – User and Application Guide”. All received comments have been adjudicated and now both documents are ready to be published. The WG discussed the preparation of a new SP on transient response, starting from the already released technical report “TR5.5-05 Transmission Line Pulse (TLP) – Transient Response Evaluation”. The WG is considering a new TR addressing statistical measurements.

The WG adjudicated the Industry Review comments on STM5.5.1 “Transmission Line Pulse (TLP) – Component Level” and determined that 2 minor technical changes need to be made before moving the document forward.

Comments from TAS were reviewed for the Rise Time section that will be added to the TLP Users Guide.

Also reviewed another new section for the Users Guide, which focuses on Pulse Voltage.  This section, along with the Rise Time section will be sent to TAS for review as they do contain some cross references.    

WG Chair discussed the potential next steps for the WG.  A survey was sent to members for feedback on what they believe should be worked on next.  One item of discussion is the Transient Response, and this will be reviewed in a future conference call or face to face meeting.

The WG adjudicated TAS comments on the five year review revisions of ANSI/ESD STM5.5.1. The document is expected to be distributed for STDCOM VBM. A status update was given on additions to the user guide of rise time verification and reporting.

The WG adjudicated TAS comments on a new section of ESD TR5.5-04 - User Guide. The document will be sent for TAS review before the June meeting series. A presentation was given with follow-up discussion on rise time definition and measurements. The WG will finalize updates to the five-year revisions to ANSI/ESD STM5.5.1 and submit for TAS review before the September meeting series.

The group concluded on a new section for the currently published ESD TR5.5-04 - User Guide. The document will be sent for TAS review before the June meeting series. The group also adjudicated WG member comments on revisions during the five-year review of ANSI/ESD STM5.5.1. A presentation was given on rise time aspects, which resulted in a lively and fruitful discussion. A task team will draft an outline with proposals for topics to be addressed in ANSI/ESD STM5.5.1, ESD TR5.5-01, and/or a new TR.

Summary of meeting activities: 

The group discussed several reviewer comments on the five-year review of ANSI/ESD STM5.5.1. Two sub teams were formed to address a rise-time discussion and the structure of Section 5.0. A presentation on WG26 (system level ESD models) activities was given. A meeting will be arranged to discuss possibilities for collaboration. A presentation was given on a section for the user guide discussing 500-Ohm TLP and suggested wording will be sent to the WG for review.