Gary has been a member of the ESD Association since 1994, and a member of the 5.0 Device Testing Committee for 10 years. He has also served as chairman of Working Group 5.4 since 1996; this group is engaged in using transients to assess latch-up robustness. Gary has also served as a member or alternate on HBM, CDM, or TLP working groups at various times during his membership. He is currently involved in an effort by Working Group 5.1 to adapt the HBM Standard to complex high pin-count ICs to which he has contributed data & simulations describing the loading effect of multi-pin power nodes and proposed single node stressing. Gary has published papers on transient-induced latch-up testing at the 1995 and 1999 EOS/ESD Symposia, served on the Symposium Technical Program Committee in 1999 and 2000, and is co-author of a paper on the effects of spurious voltages on HBM simulators that will be presented at the 2004 EOS/ESD Symposium.
Educational and Professional Background:
Gary received a BS degree in Physics, and completed post-graduate classes in math, physics, and electrical engineering. Gary’s 35-year career includes 17 years analyzing and correcting IC design weaknesses including ESD and latch-up. He has been designing on-chip ESD protection for 4 years. As well as his membership in the ESD Association, Gary has also been a member of IEEE and ASM(ISTFA).
Personal information, interests and hobbies:
Gary is a licensed radio amateur interested in VHF repeater design and construction. He presently serves as an officer on two local HAM radio clubs. Gary is also an avid water skier during the summer months.
When we asked Gary to tell us how volunteering for the ESD Association has contributed to his professional and personal growth, this is what he said:
“Participation in ESDA activities has helped me to hone my skills in running effective meetings and working within a team environment. The interaction with others who have similar experiences and interests has broadened my perspective and affected the way in which I approach problems. The working group participation has kept me current on important issues which directly impact my employer and make me more valuable in this regard.”