"Through the ESDA, I meet the people at the forefront of combating EOS/ESD problems in microelectronic systems and from them I learn a great deal and also get ideas for new research avenues."
Dr. Elyse Rosenbaum received a B.S. degree (with distinction) from Cornell University in 1984, a M.S. degree from Stanford University in 1985, and a Ph.D. degree from the University of California, Berkeley in 1992. All of these degrees were in electrical engineering. From 1984 through 1987, she was a Member of the Technical Staff at AT&T Bell Laboratories in Holmdel, NJ. She is currently a Professor in the Department of Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign.
Elyse's present research interests include design, testing, modeling and simulation of ESD protection circuits, design of high-speed circuits with ESD protection, latch-up, gate oxide degradation, and substrate noise coupling. She has authored or coauthored over 100 technical papers, including coauthor/research-advisor for three Best Student Papers awarded at EOS/ESD Symposium (2003, 2009, 2010). She is an editor for IEEE Transactions on Device and Materials Reliability. She was the keynote lecturer at the 2004 Taiwan ESD Conference, and has given invited lectures at many universities and industrial laboratories.
Elyse has been a member of the ESD Association for eight years, presented tutorials on modeling and simulation of on-chip protection circuits at the EOS/ESD Symposium, and has served as a Subcommittee chairperson for the 2003 and 2006 EOS/ESD Symposium. She has also been a member of the symposium technical program committee for the past seven years.
In her leisure time Elyse likes to cook, go swimming, take nature walks, and bike rides.