EOS/ESD Association, Inc.

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Symposium Schedule

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2017 Symposium Program pdf

SUNDAY, September 10, 2017

Registration 7:30 a.m. - 5:00 p.m.

S20.20 Seminar Day 1
8:00 a.m. - 5:00 p.m. FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) (PrM) (Day 1)

Tutorials
8:00 a.m. - 12:00 p.m. DD110: ESD Basics to Advanced Protection Design (DD)
8:30 a.m. - 4:30 p.m. FC100: ESD Basics for the Program Manager (PrM)
8:30 a.m. - 12:00 p.m. DD200: Charged Device Model Phenomena, Design, and Modeling (DD)
8:30 a.m. - 12:00 p.m. DD/FC130: System Level ESD/EMI: Testing to IEC & Other Standards (PrM), (DD)
8:30 a.m. - 12:00 p.m. DD/FC155: ESD Control Workstations: Set-up, Practical Considerations, and Measurements
8:30 a.m. - 10:00 a.m. DD/FC161: Perfect ESD Storm
10:30 a.m. - 12:00 p.m. DD/FC330: Control of Charged Board Event (CBE) NEW
1:00 p.m. - 4:30 p.m. DD201: ESD Protection and I/O Design
1:00 p.m. - 4:30 p.m. DD204: ESD Design in HV Technologies
1:00 p.m. - 4:30 p.m. FC164: Costly Controversial ESD Myths
1:00 p.m. - 4:30 p.m. FC370: Basics of EMI and EOS in Manufacturing Environment and First Mitigation NEW

MONDAY, September 11, 2017

Registration 7:30 a.m. - 5:00 p.m.

S20.20 Seminar Day 2
8:00 a.m. - 5:00 p.m. FC340: ESD Program Development and Assessment (ANSI/ESD S20.20 Seminar) (PrM) (Day 2)

Tutorials
8:30 a.m. - 4:30 p.m. FC101: How To’s of In-Plant ESD Auditing and Evaluation Measurements (PrM)
8:30 a.m. - 12:00 p.m. DD231: ESD System Level: Physics, Testing, Debugging of Soft and Hard Failures NEW/REVISED
8:30 a.m. - 12:00 p.m. DD103: An Overview of Integrated Circuit ESD: The ESD Threat, Testing, Design Concepts, and Debugging
8:30 a.m. - 12:00 p.m. FC360: Electrical Overstress (EOS) in Manufacturing and Test
8:30 a.m. - 12:00 p.m. FC200: Packaging Principles for the Program Manager (PrM)
8:30 a.m. - 10:00 a.m. DD213: ESD, EOS, and Latch-up Failure Analysis for Designers
10:30 a.m. - 12:00 p.m. DD300: Circuit-Level Modeling and Simulation of On-Chip Protection (DD)
1:00 p.m. - 4:30 p.m. DD340: Integrated ESD Device and Board Level Design NEW
1:00 p.m. - 4:30 p.m. DD319: Physical Process, Device, and Circuit Simulation (TCAD) Methodologies in Application to Industrial ESD Research and Design
1:00 p.m. - 4:30 p.m. FC215: Device Technology and Failure Analysis Overview (PrM)
1:00 p.m. - 4:30 p.m. DD/FC380: Electrostatic Calculations for the Program Manager and the ESD Engineer (PrM)
1:00 p.m. - 2:30 p.m. DD203: Designing ESD Protection for RF and mmWave CMOS Circuits
3:00 p.m. - 4:30 p.m. DD317: ESD Challenges in Advanced FinFET and Gate-All-Around Nanowire CMOS Technologies NEW

Reception
5:00 p.m. - 6:00 p.m. Professional and Technical Women’s Reception

Welcome Reception
6:00 p.m. - 9:00 p.m. Exhibits Open

TUESDAY, September 12, 2017

Registration 7:30 a.m. - 5:00 p.m.

Awards Breakfast
7:30 a.m. - 9:45 a.m. Annual Meeting and Awards Breakfast

Keynote: The Mission and some Challenges Dr. Alicia R. Allbaugh
9:00 a.m. - 9:45 a.m. 

Exhibits Open
9:30 a.m. - 5:30 p.m.

Technical Sessions
10:10 a.m.-10:20 a.m. Exhibitor Showcase in Session 1A and 1B
10:20 a.m.-12:00 p.m. 1A: Advanced CMOS I
10:20 a.m.-12:00 p.m. 1B: Manufacturing I
1:10 p.m. - 2:40 p.m. Hands On Session I New Session!
                 1:10 p.m. - 2:40 p.m. Measurement in ESD Control Standards
1:10 p.m. - 1:20 p.m. Exhibitor Showcase in Sessions 2A and 2B
1:20 p.m. - 2:35 p.m. 2A: RF / High Voltage I
1:20 p.m. - 2:35 p.m. 2B: ESD Failure Case Studies I
3:20 p.m. - 3:30 p.m. Exhibitor Showcase in Sessions 3A and 3B
3:30 p.m. - 5:10 p.m. 3A: System Level ESD I
3:30 p.m. - 5:10 p.m. 3B: EOS/ESD EDA Tools
3:30 p.m. - 3:40 p.m. Exhibitor Showcase in Invited Speaker Session
3:40 p.m. - 5:00 p.m. Invited Speaker Session New Session! 
                
3:40 p.m. - 4:25 p.m. I: Beyond S20.20: Explosives
                
4:25 p.m. - 5:00 p.m. II: IoT Challenges for Manufacturing

Study Session
5:00 p.m. - 6:00 p.m. Calculations and ESD Scenarios Review for ESD Program Manager Exam Preparation (STUDY SESSION)

Workshops 
5:30 p.m. - 7:00 p.m. A.1 Friendly ESD Integration of 3rd Party IP in SoCs?
                                  A.2 One Year after The Industry Council White Paper 4 Release
                                  A.3 Beyond ANSI/ESD S20.20: High Reliability ESD Control Processes and Lower ESD Sensitivities
                                  A.4 HBM and CDM Standards – Recent Advances and Application to Devices

WEDNESDAY, September 13, 2017

Registration 7:30 a.m. - 5:00 p.m.

Exhibits Open
8:30 a.m. - 1:30 p.m.

Technical Sessions
8:00 a.m. - 8:40 a.m. Year in Review: The Birth and the Life of an EOS/ESD Association, Inc. Standard
9:10 a.m. - 9:20 a.m. Exhibitor Showcase in Sessions 4B
9:20 a.m. - 11:10 a.m. 4B: Manufacturing II
9:30 a.m. - 9:40 a.m. Exhibitor Showcase in Sessions 4A
9:40 a.m. - 11:20 a.m. 4A: On-Chip Physics
1:05 p.m. - 3:05 p.m. Hands On Session II New Session!
               1:05 p.m. - 1:35 p.m.  II.A How to Detect ESD Events by EMI (ESD Event Detectors, Antenna, and Scope)?
               1:35 p.m. - 2:05 p.m.  II.B Detecting and Solving EMI Problems in Manufacturing
               2:05 p.m. - 2:35 p.m.  II.C Measuring Grounds in a Facility
               2:35 p.m. - 3:05 p.m.  II.D ESD Field Measurement Pitfalls and ESD Voltage Suppression Demonstration
                                                         (ANSI/ESD S20.20 and IEC61340-5-1 Differences)
1:35 p.m. - 2:50 p.m. 5A: Testing I
1:35 p.m. - 2:50 p.m. 5B: RF / High Voltage II
3:20 p.m. - 5:00 p.m. 6A: System level ESD II
3:20 p.m. - 4:35 p.m. 6B: Advanced CMOS II
3:25 p.m. - 5:10 p.m. Tutorial Session I: New Session! 
                3:25 p.m. - 4:00 p.m.  I.A Cable Discharge Events in Assembly and Testing
                4:00 p.m. - 4:35 p.m.  I.B Packages, Tape & Reel, Trays, and Others: How to Assess ESD Compliance?
                4:35 p.m. - 5:10 p.m.  I.C Standard Practice on Proposed New Ionizer Measurement Methods

Workshops
5:30 p.m. - 7:00 p.m. B.1 EDA for Latch-up: Which are the Most Suitable Approaches?
                                  B.2 ESD and EMI Codesign – a Topic Both for IC and PCB Designers "World- Café Style" Format
                                                  
B.3 Machine Model and the Impact on Manufacturing
                                  B.4 A Best Practice Procedure for EOS Analysis in the Automotive Industry - How can We Improve our Knowledge Sharing?

Reception
7:00 p.m. - 9:00 p.m. General Chair's Reception Open to all symposium attendees! 
                                   
Poster presentations of technical papers from all sessions will be on display!

THURSDAY, September 14, 2017

Registration 7:30 a.m. - 5:00 p.m.

Technical Sessions
8:00 a.m. - 8:40 a.m. Year in Review: Transmission Line Pulse Testing for ESD
8:50 a.m. - 10:20 a.m. Discussion Group Session New Session!
                                    DG.A CDM Controls for Class 0
                                    DG.B Electrical Overstress in Manufacturing – Mitigation Strategies and Standards
                                    DG.C ESD Control Program Management for Contract Manufacturing
8:50 a.m. - 10:05 a.m. 7A: ESD Failure Case Studies II
10:25 a.m. - 11:40 a.m. 8A: Testing II
10:40 a.m. - 12:25 p.m. Tutorial Session II New Session!
                   10:40 a.m. - 11:15 a.m.  II.A ANSI/ESD STM11.31: Describe the Test Method and the Differences Between Good and Bad Bags
                   11:15 a.m. - 11:50 a.m.  II.B Charged Board Event and the Correlation to Charged Device Model 
                   11:50 a.m. - 12:25 p.m.  II.C “Meet the Standard” with History, Background, and Contents
11:40 a.m. - 11:45 a.m. On-Chip ESD Design Technical Session Closing
12:25 p.m. - 12:30 p.m. EOS/ESD in Manufacturing Technical Session Closing

Tutorials
8:00 a.m. - 4:30 p.m. FC390: Basics of ESD Process Assessment
8:30 a.m. - 12:00 p.m. DD260: Design for EOS Reliability NEW
8:30 a.m. - 12:00 p.m. FC210: ESD Standards Overview for the Program Manager (PrM)
8:30 a.m. - 12:00 p.m. FC120: Air Ionization Issues and Answers for the Program Manager (PrM)
1:00 p.m. - 4:30 p.m. DD220: Transmission Line Pulse (TLP) Basics and Applications (DD)
1:00 p.m. - 4:30 p.m. FC262: Electrical Fields and Particles - Practical Considerations for the Factory NEW
1:00 p.m. - 4:30 p.m. FC110: Cleanroom Considerations for the Program Manager (PrM)
1:00 p.m. - 2:30 p.m. DD381: Electronic Design Automation (EDA) Solutions for ESD
3:00 p.m. - 4:30 p.m. DD382: Electronic Design Automation (EDA) Solutions for Latch-up

FRIDAY, September 15, 2017 

8:00 a.m. - 5:00 p.m. Device Design Certification Exam
8:00 a.m. - 5:00 p.m. Program Manager Certification Exam