Tom Meuse is an Applications/Product/Technology Engineer at Thermo Fisher Scientific, Compliance Test Solutions division located in Tewksbury MA, USA. He is responsible for the Thermo Scientific ESD/Latch-up and TLP test systems operations/future product research and is also a member of the senior staff.
Tom is a member of the EOS/ESD Association, Inc. Device Testing (WG-5.x) committee, chair of the ESDA’s WG14 System Level ESD and a member of the JEDEC JC-14.1 Committee on Reliability Test Methods, with a focus on latch-up (JESD78). He’s also a member of the Joint ESDA/JEDEC Device Testing work group and a contributing member to the Industry Council on ESD Target Levels. Tom has also contributed on the EOS/ESD Symposium technical program committees (TPC) as a sub-chair, document reviewer and an author mentor, all leading to a better technical symposium.
During Tom’s 40 plus year career, which began with KeyTek Instruments, he worked on Surge and ESD simulator designs. He’s provided numerous technical seminars and presented invited talks focusing on ESD/Latch-up testing and Standards Evolution. He’s authored and co-authored numerous papers on topics relating to ESD device level testing and ESD system design at different conferences worldwide, such as the EOS/ESD symposium and IEW.