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EOS/ESD Symposium Presents Best Paper and Presentation Awards (10/03) The EOS/ESD Symposium has presented its Best Paper, Best Student Paper, and Best Presentation awards from the 2002 Symposium. The awards were presented September 22, 2003 during the annual awards breakfast at the 2003 Symposium in Las Vegas, NV.
The Best Student Paper was presented to Yung-Chul Jeon, Seung-Chul Lee, Jae-Keun Oh, Soo-Seong Kim, and Min-Koo Han, Seoul National University; and Yong-Icc Jung, Hyung-Tae So, Jin-Seop Shim, and Kil-Ho Kim, Hynix Semiconductor Inc. for their paper on ESD Characterization of Grounded-Gate NMOS with 0.35 µm/18 V Technology Employing Transmission Line Pulser (TLP) Test. The Best Paper and the Best Student
paper are based on the technical content of the paper and are chosen by the
Symposium’s technical program committee. The Best Presentation is based
on the presentation quality and style at the Symposium and is determined by
the attendees. The Symposium addresses the effects of electrical overstress (EOS), electrostatic discharge (ESD) and electrostatics on electronic and non-electronic devices, assemblies, systems, and processes. It is sponsored by the ESD Association in cooperation with the IEEE. It is technically co-sponsored by the Electron Devices Society.
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