The IEW provides a unique environment for envisioning, developing, and sharing robust design and test of ESD protection for state-of-the-art integrated circuits as well as advanced semiconductor system on chip (SOC) and system in package (SIP) applications.
“The IEW 2014 was a great experience to take a look how other companies deal with ESD related problems. You meet a lot of high skilled people with a different mindset and different strategies addressing similar technical challenges. It is really a very technical oriented event where you can discuss ESD related things like fail modes, measurement techniques, design methodologies,… on a very detail level.
Besides this it’s a great place to present your own work in front of an industry wide audience and receive a lot of valuable feedback. All these activities happens in a very familiar atmosphere where it doesn’t matter if you’re new to this topic or if you have long experience.”
Dietmar Walther, Texas Instruments. Attended IEW 2014.