Warren Anderson

Robert Ashton

Gianluca Boselli

DEVICE DESIGN
Gianluca Boselli completed his Masters in E.E. at the University of Parma, Italy, in 1996. In 2001, he completed his Ph.D. at the University of Twente, The Netherlands.

In 2001, he joined Texas Instruments, Dallas, Texas, where he focused on ESD and Latch-up development for advanced CMOS technologies. Recently, his responsibilities extended into ESD development of Analog technologies.

He authored several papers in the area of ESD and Latch-up. He presented his work at major conferences, including EOS/ESD Symposium, IEDM, and IRPS. He also presented several invited papers and/or tutorials at the EOS/ESD Symposium, IRPS, IEDM, ESREF, and RCJ.

Dr. Boselli has been the recipient of the “Best Paper Award” on behalf of Microelectronics Reliability Journal in 2000. He received “The Best Paper Award” at the EOS/ESD Symposium in 2002. He also received the “The Best Presentation Award” at the EOS/ESD Symposium in 2002 and in 2006.

Michael Chaine

DEVICE DESIGN
Mike Chaine works at Micron Technology, Inc., in Boise, Idaho, as a Section Manager in the R&D Reliability Group. He has a B.S.E.E. degree from Arizona State University and has worked at Micron since 1998. Today, he is leading the R&D Reliability Group in the area of ESD/LUP design and development, and has two engineers reporting to him.

He is working in the area of On-Chip ESD protection design for all advanced DRAM and FLASH technologies. These responsibilities include ESD wafer and device level characterization analysis, ESD circuit failure analysis, and ESD design and layout rule development.

Mike has authored several papers on a variety of ESD areas ranging from ESD device test issues, ESD protection circuit analysis, and unique ESD circuit interaction phenomena. He holds more than 10 ESD patents and has several patents pending.

Mike chairs two different IC device work groups; Human Body Model (HBM) WG5.1 and Socketed Device Model (SDM) WG5.3.2.

Charvaka Duvvury

DEVICE DESIGN
Charvaka Duvvury received his Ph.D. in Engineering Science and worked as a Post-Doctoral Fellow in Physics. He is a Texas Instruments Fellow working in the External Development and Manufacturing Group. His current work is on the development and company wide support of ESD for the nanometer submicron CMOS technologies. Charvaka has made numerous international presentations on ESD phenomena and on-chip protection design. He has published over 130 papers in technical journals and conferences, holds 64 patents, and has co-authored 3 books.  He is a recipient of the Outstanding Contributions Award from the ESD Symposium (1990) and numerous Best Paper/Best Presentation awards from the ESD Symposium.  Charvaka served as the General Chairman of the ESD Symposium both in 1994 and in 2005. He has been a member of the ESD Association Board of Directors since 1997, promoting university education and research in ESD. Charvaka is also a Fellow of the IEEE.

Ronald Gibson

DEVICE DESIGN
PROGRAM MANAGER
Ron Gibson specializes in manufacturing process control, training, and facility certification in accordance with ANSI/ESD S20.20. He is well known internationally as an outstanding ESD practitioner and as a major contributor to ESD technology since 1987. He is Celestica International’s Global Engineering Consultant and Corporate ESD Program Manager. He provides ESD technical guidance to all Celestica manufacturing sites, worldwide. Ron is highly experienced in manufacturing technology, packaging and all areas of ESD control in the electronic manufacturing process.

Ron is active in the International Electrotechnical Commission (IEC) as the Standards Council of Canada’s (SCC) national representative. In his position as Chair for IEC Technical Committee (TC) 101, Working Group 5, the important ESD Program Standard IEC 61340-5-1 and Handbook IEC 61340-5-2 were fully redeveloped to be technically equivalent to ANSI/ESD S20.20. He served as the ESD Association’s Standards Chair for 10 years and has been a member of the ESD Association since 1988. He has been active in several standards development committees, a contributor to and past General Chairman of the EOS/ESD Technical Symposium, and served in every association officer’s position, including consecutive terms as Treasurer and ESDA President. As a co-founder and developer of the Professional ESD Program Manager Certification program, Ron has lectured and taught a variety of ESD courses internationally for major corporations and professional associations.

Ron received the ESD industry’s highest award, the ESDA Outstanding Contribution Award, for his innovation and extensive list of technical contributions. In particular, he chaired the development and launched the ESD Association’s Facility ESD Certification program based on the ANSI/ESD S20.20 standard. This important benchmark is designed to confirm the effectiveness of a facility’s ESD control program and reduce losses, manufacturing costs, and enhance product reliability. ESD Program Certification is provided to electronics manufacturing facilities only through 3rd party ISO9000 registrars. Ron’s team has trained over 160 ISO9000 Lead Assessors globally.

Leo G. Henry, Ph.D

DEVICE DESIGN
PROGRAM MANAGER
Leo G. Henry is presently an ESD Consulting Engineer.  He has worked in the electronics industry for over 25 years and in the field of EOS and ESD for over 19 years.  Over the years, Leo G. has worked in several engineering capacities for several companies (ORYX, BEI, ION, GTL, EPI), and spent over 14 years at Advanced Micro Devices (AMD) as a Member of the Engineering Technical Staff (MTS).

Leo G. received his B.Sc. and M.Sc. degrees in Physics from the University of the West Indies.  He received his M.S. and Ph.D. degrees in Materials Science & Engineering at the University of California at Berkeley, USA.

Dr. Henry has taught Physics, Materials Science, and Failure Analysis (FA) Principles at SJS University, and ESD at various conferences and symposiums from 1997-2008.  He has also presented at conferences and published many papers on ESD, EOS, TLP, FA, and Materials Science.  His technical expertise also includes system level testing using the IEC ESD standard.  

Dr. Henry is a senior member of the IEEE, a member of ASM/EDFAS, and BoD member of SiVa. Leo G. is presently overall chair of the ESD Association's ESD Device Testing Standards Working Group 5.0, and chair of the MM 5.2 WG. He has served on the ESDA's TPC (1996-2006), as National Tutorial Program (NTP) chair (2003-2006), and is a member of the Association's Technical Advisory and Support (TAS) committee for Standards.   As an elected member (1995-2000 & 2002-2008) of the Board of Directors of the ESDA, he is part of the industry liaison team, and is presently the Jr. Vice President of the ESDA Association, with overall responsibility for Education, Symposium, Standards, and ESD Facility Certification.  Leo G. teaches classes associated with the Pr.M and D.D certification programs.

Stephen Halperin

PROGRAM MANAGER
Stephen Halperin has over 30 years of ESD control experience in complex applications. Mr. Halperin formed Stephen Halperin & Associates, Limited (SH&A) in 1983, a consulting firm specializing in ESD problem analysis, laboratory testing, training, and product design. In 1992, he established Prostat Corporation for the design and manufacture of professional auditing instruments.

Mr. Halperin is known for his work in facility and process evaluation of highly sensitive environments, and his many contributions to the growth of the electrostatics industry and ESD Association (ESDA). He has lectured and consulted throughout North America, Europe, and the Far East, and has provided advisory services to major corporations in several industries. He is a charter member of the ESDA, has served several terms as an elected member of it's Board of Directors, chaired Local Chapter Development, Education, Professional Certification, and Standards committees. Mr. Halperin was elected Vice President in 1999, and served consecutive terms as Senior Vice President and President.

Mr. Halperin has been a long-term supporter of the Electrostatic Society of America and is the former Technical Advisor to ANSI’s USNC/IEC Committee. He is a recipient of the EOS/ESD Symposium’s Outstanding Paper Award, received the Association’s Outstanding Contribution Award for his work on behalf of industry. He is the recipient of the Joel P. Wiedendorf Memorial Award for his many Standards contributions. Mr. Halperin has delivered several papers on electrostatics and authored over 100 articles on related subjects. He is NARTE certified and a Certified ESD Program Manager Instructor.

Michael Hopkins

DEVICE DESIGN
PROGRAM MANAGER
Michael has nearly 30 years experience in EMC as an independent consultant, an employee of Thermo Fisher Scientific working with the KeyTek product lines, and now working with Amber Precision Instruments. He has worked closely with manufacturers and laboratories world-wide providing training, applications help, and assistance with the development of interpretation of test standards. He is the author of several papers and articles on Pulsed EMI phenomena, and has participated in numerous national and international seminars as author, speaker, and panelist. Michael has been an active member of several committees developing standards for industry including the ESD Association, IEC Technical Committees 77A and B for the development and maintenance of Basic EMC Standards (US Delegate to Maintenance Team 12 for all pulsed phenomena), IEEE/ANSI, SAE, and RTCA.

John Kinnear

PROGRAM MANAGER
John is a Senior Engineer in the Software Development and System Compliance department of IBM in Poughkeepsie, NY. He has been the ESD Site Coordinator for the Poughkeepsie and Kingston IBM sites since 1989. John is the past chairman of the IBM Interdivisional Technical Liaison Committee for ESD Protection and is currently part of the committee to develop and implement the ESD Corporate program for IBM.

John joined the company in 1979 after graduating from the State University of Buffalo, where he received a Bachelor or Science Degree in Electrical Engineering. John continued his education while working for IBM and received his Masters of Science Degree in Electrical and Computer Engineering from Syracuse University in 1986.

John has been a member of the ESD Association since 1990 and has been active in the Standards committees. Currently he is a member of the Technical and Advisory Committee and a member of the Standards Committee. He was appointed to the position of secretary of the ESD Association, elected to the Board of Directors, elected to President of the ESD Association, and was the General Chair of the EOS/ESD Symposium in 2001.

John was presented with the Joel Weidendorf award for Standards in 2005 and the Outstanding Contribution Award in 2006.

John has presented several papers both internal to IBM and at external conferences. He participates as an instructor for the Program Management series and has presented tutorials in North America and Asia.

John is the business unit manager of the facility certification program. He has trained assessors from all of our accredited certification bodies.

John is the Chief Delegate to the IEC for Technical Committee 101, Electrostatics. This committee is responsible for developing international standards. As part of this committee, the revision to IEC 61340-5-1 will be technically equivalent to ANSI/ESD S20.20-2007.

Christopher Long

PROGRAM MANAGER
Christopher Long is a senior engineer in the IBM Research Division, with over 26 years experience in semiconductor manufacturing. He currently has been involved in development of magneto-resistive random access memory (MRAM) products. Previous to this assignment, he had responsibility in the area of contamination and ESD control program strategy at IBM 200 & 300mm semiconductor manufacturing facilities. Mr. Long has published numerous papers on semiconductor manufacturing defect reduction and yield modeling, and has served as U.S. chair of the International Technology Roadmap for Semiconductors (ITRS) Yield Enhancement technology working group, responsible for development of the Yield Enhancement chapters of the 2001 and 2003 ITRS. Mr. Long received a B.S. in Physics from Beloit College, Beloit, WI (1980), and an M.S. in Engineering from the Thayer School of Engineering, Dartmouth College (1990), Hanover, NH.  cwlong@us.ibm.com

Carl Newberg

PROGRAM MANAGER
Carl Newberg is the President of MicroStat Laboratories/River’s Edge Technical Service, an independent testing laboratory and consulting service to the static and contamination control industries. He is a NARTE Certified ESD Engineer and an ESD Association Certified ESD Program Manager. He is currently the contamination Control Senior Scientist for Magnecomp Precision. Carl has been a member of the ESD Association since 1995, and is an active member of the Standards Committee, participating in working groups on ionization, packaging, cleanrooms, garments and gloves. Carl was the Technical Program Committee Chairman for the 2004 EOS/ESD Symposium, the Vice General Chairman for the 2005 EOS/ESD Symposium, and the General Chairman for the 2006 EOS/ESD Symposium.

Arnold Steinman

PROGRAM MANAGER
Arnold has worked in the static control industry since 1983, having graduated from the Polytechnic Institute of Brooklyn, receiving both B.S.E.E. and M.S.E.E. degrees.

He is a member of the Board of Directors of the ESD Association and for 12 years have served as leader of the SEMI ESD Task Force. I participate in several other industry organizations on static control issues.

As a certified ESD Program Manager, I provide static control program assessments, training, and problem solving skills. I can help build a successful static control program and assure that products are manufactured in an ESD-safe environment. My experience covers all aspects of semiconductor, hard disk drive, and electronics manufacturing, as well as, other disciplines.  I understand the problems caused by static charge, whether contamination or ESD-related.

David E. Swenson

PROGRAM MANAGER
David E. Swenson retired from 3M after 35 years of service in 2003.  The majority of his career involved electrostatic investigation, solutions to static problems, and related new product development.  After retirement, Swenson and his wife, Geri, established Affinity Static Control Consulting, LLC, to offer electrostatic solutions to industry. He has been a member of the ESD Association since 1984 and has served as Symposium General Chairman, Sr. Vice President (twice), President (1998 and 1999), and has been elected to the Board of Directors for 5 terms. A long term member of the Standards Committee and Working Group Chair for several activities, Swenson has authored or co-authored numerous technical papers on ionization, packaging materials, triboelectrification, test methods for ESD materials, and ESD control program implementation.  He has received the Association’s Outstanding Contributions Award and the Joel P. Weidendorf Memorial Award for service to standards development.  David is currently serving as President of the ESD Association. 

Steven H. Voldman

DEVICE DESIGN
Dr. Steven H. Voldman is the first IEEE Fellow for “Contributions in ESD protection in CMOS, Silicon On Insulator and Silicon Germanium Technology” and recipient of the ESDA Outstanding Contribution Award.  He received his degrees from the Univ. of Buffalo (1979); Massachusetts Institute of Technology (MIT); and from Univ. of Vermont. He supported semiconductor development for IBM, Qimonda, and TSMC corporations. He presently founded a limited liability corporation (LLC) consulting business supporting ESD design, teaching, and patent litigation.  He is an ESDA Board of Directors, Education Committee member, and WG5.5 TLP Chairman; author of the books. Physics and Devices, ESD: Circuits and Devices, ESD: Radio Frequency (RF) Technology and Circuits, Latchup, Silicon Germanium: Technology, Modeling and Design, recipient of 175 US patents. He initiated the ESD on Campus program visiting 31 universities (US, Singapore, Taiwan, Malaysia, Philippines, Thailand, and China).